S.-H. Yang, J. Y. Sheu, M. K. Ieong, M.-H. Chiang, T. Yamamoto, J. J. Liaw, S. S. Chang, Y. M. Lin, T. L. Hsu, J. R. Hwang, J. K. Ting, C. H. Wu, K. C. Ting, F. C. Yang, C. M. Liu, I. L. Wu, Y. M. Chen, S. J. Chent, K. S. Chen, J. Y. Cheng, M.-H. Tsai, W. Chang, R. Chen, C. C. Chen, T. L. Lee, C. K. Lin, S. C. Yang, Y. M. Sheu, J. T. Tzeng, L. C. Lu, S. M. Jang, C. H. Diaz, Yuh-Jier Mii. 28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-5, IEEE, 2011. [doi]
@inproceedings{YangSICYLCLHHTWTYLWCCCCTCCCLLYSTLJDM11,
title = {28nm metal-gate high-K CMOS SoC technology for high-performance mobile applications},
author = {S.-H. Yang and J. Y. Sheu and M. K. Ieong and M.-H. Chiang and T. Yamamoto and J. J. Liaw and S. S. Chang and Y. M. Lin and T. L. Hsu and J. R. Hwang and J. K. Ting and C. H. Wu and K. C. Ting and F. C. Yang and C. M. Liu and I. L. Wu and Y. M. Chen and S. J. Chent and K. S. Chen and J. Y. Cheng and M.-H. Tsai and W. Chang and R. Chen and C. C. Chen and T. L. Lee and C. K. Lin and S. C. Yang and Y. M. Sheu and J. T. Tzeng and L. C. Lu and S. M. Jang and C. H. Diaz and Yuh-Jier Mii},
year = {2011},
doi = {10.1109/CICC.2011.6055355},
url = {http://dx.doi.org/10.1109/CICC.2011.6055355},
researchr = {https://researchr.org/publication/YangSICYLCLHHTWTYLWCCCCTCCCLLYSTLJDM11},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011},
editor = {Rakesh Patel and Tom Andre and Aurangzeb Khan},
publisher = {IEEE},
isbn = {978-1-4577-0222-8},
}