Joon-Sung Yang, Nur A. Touba. Improved Trace Buffer Observation via Selective Data Capture Using 2-D Compaction for Post-Silicon Debug. IEEE Trans. VLSI Syst., 21(2):320-328, 2013. [doi]
@article{YangT13,
title = {Improved Trace Buffer Observation via Selective Data Capture Using 2-D Compaction for Post-Silicon Debug},
author = {Joon-Sung Yang and Nur A. Touba},
year = {2013},
doi = {10.1109/TVLSI.2012.2183399},
url = {http://dx.doi.org/10.1109/TVLSI.2012.2183399},
researchr = {https://researchr.org/publication/YangT13},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {21},
number = {2},
pages = {320-328},
}