Chun Yang, Lujing Tao, Jian Zhang, Xingtai Gui, Jiyang Zhang, Jianxiao Zou, Shicai Fan. A Fault Detection Method based on the Deep Extended PCA - SVM in Industrial Processes. In 2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021. pages 3620-3625, IEEE, 2021. [doi]
@inproceedings{YangTZGZZF21,
title = {A Fault Detection Method based on the Deep Extended PCA - SVM in Industrial Processes},
author = {Chun Yang and Lujing Tao and Jian Zhang and Xingtai Gui and Jiyang Zhang and Jianxiao Zou and Shicai Fan},
year = {2021},
doi = {10.23919/ACC50511.2021.9482824},
url = {https://doi.org/10.23919/ACC50511.2021.9482824},
researchr = {https://researchr.org/publication/YangTZGZZF21},
cites = {0},
citedby = {0},
pages = {3620-3625},
booktitle = {2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4197-1},
}