Josh Yang, Baosheng Wang, André Ivanov. Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 493-498, IEEE Computer Society, 2004. [doi]
Abstract is missing.