Bo Yang, Kaijie Wu, Ramesh Karri. Secure Scan: A Design-for-Test Architecture for Crypto Chips. IEEE Trans. on CAD of Integrated Circuits and Systems, 25(10):2287-2293, 2006. [doi]
@article{YangWK06:2,
title = {Secure Scan: A Design-for-Test Architecture for Crypto Chips},
author = {Bo Yang and Kaijie Wu and Ramesh Karri},
year = {2006},
doi = {10.1109/TCAD.2005.862745},
url = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2005.862745},
tags = {architecture, testing, design},
researchr = {https://researchr.org/publication/YangWK06%3A2},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {25},
number = {10},
pages = {2287-2293},
}