Feature Extraction base on Local Maximum Margin Criterion

Wankou Yang, Jianguo Wang, Mingwu Ren, Jingyu Yang. Feature Extraction base on Local Maximum Margin Criterion. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Abstract

Abstract is missing.