Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM

Hao-I Yang, Shyh-Chyi Yang, Wei Hwang, Ching-Te Chuang. Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM. IEEE Trans. on Circuits and Systems, 58-I(6):1239-1251, 2011. [doi]

Authors

Hao-I Yang

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Shyh-Chyi Yang

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Wei Hwang

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Ching-Te Chuang

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