Hao-I Yang, Shyh-Chyi Yang, Wei Hwang, Ching-Te Chuang. Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM. IEEE Trans. on Circuits and Systems, 58-I(6):1239-1251, 2011. [doi]
@article{YangYHC11,
title = {Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM},
author = {Hao-I Yang and Shyh-Chyi Yang and Wei Hwang and Ching-Te Chuang},
year = {2011},
doi = {10.1109/TCSI.2010.2096112},
url = {http://dx.doi.org/10.1109/TCSI.2010.2096112},
researchr = {https://researchr.org/publication/YangYHC11},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {58-I},
number = {6},
pages = {1239-1251},
}