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Hao-I Yang, Shyh-Chyi Yang, Wei Hwang, Ching-Te Chuang. Impacts of NBTI/PBTI on Timing Control Circuits and Degradation Tolerant Design in Nanoscale CMOS SRAM. IEEE Trans. on Circuits and Systems, 58-I(6):1239-1251, 2011. [doi]
Abstract is missing.