Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process - researchr publication authors

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Zhaonian Yang, Yuan Yang, Ningmei Yu, Juin J. Liou. Statically triggered 3×VDD-Tolerant ESD detection circuit in a 90-nm low-voltage CMOS process. Microelectronics Journal, 78:88-93, 2018. [doi]

This author has not been identified. Look up 'Zhaonian Yang' in GoogleThis author has not been identified. Look up 'Yuan Yang' in GoogleThis author has not been identified. Look up 'Ningmei Yu' in GoogleThis author has not been identified. Look up 'Juin J. Liou' in Google

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