An optimized DFT technology based on machine learning

Han Yang, Zeyu Zhao, Zhikuang Cai. An optimized DFT technology based on machine learning. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-4, IEEE, 2021. [doi]

Authors

Han Yang

This author has not been identified. Look up 'Han Yang' in Google

Zeyu Zhao

This author has not been identified. Look up 'Zeyu Zhao' in Google

Zhikuang Cai

This author has not been identified. Look up 'Zhikuang Cai' in Google