Han Yang, Zeyu Zhao, Zhikuang Cai. An optimized DFT technology based on machine learning. In IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{YangZC21-5,
title = {An optimized DFT technology based on machine learning},
author = {Han Yang and Zeyu Zhao and Zhikuang Cai},
year = {2021},
doi = {10.1109/ITC-Asia53059.2021.9808628},
url = {https://doi.org/10.1109/ITC-Asia53059.2021.9808628},
researchr = {https://researchr.org/publication/YangZC21-5},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2021, Shanghai, China, August 18-20, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1334-3},
}