Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform - researchr publication authors

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Kai Yang, Yanqing Zhao, Jianguo Yang, Xiaoyong Xue, Yinyin Lin, Jun-Soo Bae. Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

This author has not been identified. Look up 'Kai Yang' in GoogleThis author has not been identified. Look up 'Yanqing Zhao' in GoogleThis author has not been identified. Look up 'Jianguo Yang' in GoogleThis author has not been identified. Look up 'Xiaoyong Xue' in GoogleThis author has not been identified. Look up 'Yinyin Lin' in GoogleThis author has not been identified. Look up 'Jun-Soo Bae' in Google

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