Kai Yang, Yanqing Zhao, Jianguo Yang, Xiaoyong Xue, Yinyin Lin, Jun-Soo Bae. Impacts of external magnetic field and high temperature disturbance on MRAM reliability based on FPGA test platform. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.