Power and Thermal Constrained Test Scheduling Under Deep Submicron Technologies

Chunhua Yao, Kewal K. Saluja, Parameswaran Ramanathan. Power and Thermal Constrained Test Scheduling Under Deep Submicron Technologies. IEEE Trans. on CAD of Integrated Circuits and Systems, 30(2):317-322, 2011. [doi]

Abstract

Abstract is missing.