Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling

Jian Yao, Zuochang Ye, Yan Wang. Efficient importance sampling for high-sigma yield analysis with adaptive online surrogate modeling. In Enrico Macii, editor, Design, Automation and Test in Europe, DATE 13, Grenoble, France, March 18-22, 2013. pages 1291-1296, EDA Consortium San Jose, CA, USA / ACM DL, 2013. [doi]

Abstract

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