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Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location

Kosala Yapabandara, Vahid Mirkhani, Shiqiang Wang, Min P. Khanal, Sunil Uprety, Tamara Isaacs-Smith, Michael C. Hamilton, Minseo Park. Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location. Microelectronics Reliability, 91:262-268, 2018. [doi]

Authors

Kosala Yapabandara

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Vahid Mirkhani

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Shiqiang Wang

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Min P. Khanal

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Sunil Uprety

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Tamara Isaacs-Smith

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Michael C. Hamilton

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Minseo Park

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