Kosala Yapabandara, Vahid Mirkhani, Shiqiang Wang, Min P. Khanal, Sunil Uprety, Tamara Isaacs-Smith, Michael C. Hamilton, Minseo Park. Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location. Microelectronics Reliability, 91:262-268, 2018. [doi]
@article{YapabandaraMWKU18,
title = {Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location},
author = {Kosala Yapabandara and Vahid Mirkhani and Shiqiang Wang and Min P. Khanal and Sunil Uprety and Tamara Isaacs-Smith and Michael C. Hamilton and Minseo Park},
year = {2018},
doi = {10.1016/j.microrel.2018.10.011},
url = {https://doi.org/10.1016/j.microrel.2018.10.011},
researchr = {https://researchr.org/publication/YapabandaraMWKU18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {262-268},
}