Tohid Taghizad Gogjeh Yaran, Suleyman Tosun. Improving combinational circuit resilience against soft errors via selective resource allocation. In Manfred Dietrich, Ondrej Novák, editors, 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2017, Dresden, Germany, April 19-21, 2017. pages 12-15, IEEE, 2017. [doi]
Abstract is missing.