Leonid Yavits, Lois Orosa 0001, Suyash Mahar, João Dinis Ferreira, Mattan Erez, Ran Ginosar, Onur Mutlu. WoLFRaM: Enhancing Wear-Leveling and Fault Tolerance in Resistive Memories using Programmable Address Decoders. In 38th IEEE International Conference on Computer Design, ICCD 2020, Hartford, CT, USA, October 18-21, 2020. pages 187-196, IEEE, 2020. [doi]
@inproceedings{YavitsOMFEGM20,
title = {WoLFRaM: Enhancing Wear-Leveling and Fault Tolerance in Resistive Memories using Programmable Address Decoders},
author = {Leonid Yavits and Lois Orosa 0001 and Suyash Mahar and João Dinis Ferreira and Mattan Erez and Ran Ginosar and Onur Mutlu},
year = {2020},
doi = {10.1109/ICCD50377.2020.00044},
url = {https://doi.org/10.1109/ICCD50377.2020.00044},
researchr = {https://researchr.org/publication/YavitsOMFEGM20},
cites = {0},
citedby = {0},
pages = {187-196},
booktitle = {38th IEEE International Conference on Computer Design, ICCD 2020, Hartford, CT, USA, October 18-21, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9710-4},
}