Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory

Min Ye, Qiao Li 0001, Jianqiang Nie, Tei-Wei Kuo, Chun Jason Xue. Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory. In 2020 Design, Automation & Test in Europe Conference & Exhibition, DATE 2020, Grenoble, France, March 9-13, 2020. pages 109-114, IEEE, 2020. [doi]

Abstract

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