Jing Ye, Yu Huang, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li 0001, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan. Diagnosis and Layout Aware (DLA) Scan Chain Stitching. IEEE Trans. VLSI Syst., 23(3):466-479, 2015. [doi]
Abstract is missing.