Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads - researchr publication

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Kai Ye, Marcel H. Schulz, Quan Long, Rolf Apweiler, Zemin Ning. Pindel: a pattern growth approach to detect break points of large deletions and medium sized insertions from paired-end short reads. Bioinformatics, 25(21):2865-2871, 2009. [doi]

Abstract is missing.

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