Wei Ye, Bei Yu, David Z. Pan, Yongchan Ban, Lars Liebmann. Standard Cell Layout Regularity and Pin Access Optimization Considering Middle-of-Line. In Alex K. Jones, Hai Helen Li, Ayse Kivilcim Coskun, Martin Margala, editors, Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20 - 22, 2015. pages 289-294, ACM, 2015. [doi]
Abstract is missing.