Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang 0014, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski. Efficient Test Compression Configuration Selection. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):2323-2336, 2022. [doi]
@article{YeZT0LCRZKR22,
title = {Efficient Test Compression Configuration Selection},
author = {Chong-Siao Ye and Shi-Xuan Zheng and Fong-Jyun Tsai and Chen Wang 0014 and Kuen-Jong Lee and Wu-Tung Cheng and Sudhakar M. Reddy and Justyna Zawada and Mark Kassab and Janusz Rajski},
year = {2022},
doi = {10.1109/TCAD.2021.3099100},
url = {https://doi.org/10.1109/TCAD.2021.3099100},
researchr = {https://researchr.org/publication/YeZT0LCRZKR22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {41},
number = {7},
pages = {2323-2336},
}