Chong-Siao Ye, Shi-Xuan Zheng, Fong-Jyun Tsai, Chen Wang 0014, Kuen-Jong Lee, Wu-Tung Cheng, Sudhakar M. Reddy, Justyna Zawada, Mark Kassab, Janusz Rajski. Efficient Test Compression Configuration Selection. IEEE Trans. on CAD of Integrated Circuits and Systems, 41(7):2323-2336, 2022. [doi]
Abstract is missing.