Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference

Mark Yeary, Wendy Van Moer. Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference. IEEE T. Instrumentation and Measurement, 60(5):1503-1504, 2011. [doi]

Authors

Mark Yeary

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Wendy Van Moer

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