Mark Yeary, Wendy Van Moer. Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference. IEEE T. Instrumentation and Measurement, 60(5):1503-1504, 2011. [doi]
@article{YearyM11,
title = {Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference},
author = {Mark Yeary and Wendy Van Moer},
year = {2011},
doi = {10.1109/TIM.2011.2114530},
url = {http://dx.doi.org/10.1109/TIM.2011.2114530},
researchr = {https://researchr.org/publication/YearyM11},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {60},
number = {5},
pages = {1503-1504},
}