Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference - researchr publication related

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Mark Yeary, Wendy Van Moer. Guest Editorial Special Issue on the 2010 IEEE International Instrumentation and Measurement Conference. IEEE T. Instrumentation and Measurement, 60(5):1503-1504, 2011. [doi]

The following publications are possibly variants of this publication:

Guest Editorial: Special Issue on the 2014 IEEE International Instrumentation and Measurement Technology ConferenceDaniel Slomovitz, Wendy Van Moer, Bernardo Tellini. tim, 64(5):1098-1099, 2015. [doi]

Guest Editorial Special Issue on the 2015 IEEE International Instrumentation and Measurement Technology Conference Pisa, Italy, May 11-14, 2015Shervin Shirmohammadi, Pasquale Daponte, Wendy Van Moer. tim, 65(5):958-959, 2016. [doi]

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