Ralf E.-H. Yee, Nicholas Y.-J. Su, Lowry P.-T. Wang, Charles H.-P. Wen, Herming Chiueh. Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics. In 42nd IEEE VLSI Test Symposium, VTS 2024, Tempe, AZ, USA, April 22-24, 2024. pages 1-7, IEEE, 2024. [doi]
Abstract is missing.