Kuen-Wei Yeh, Jiun-Lang Huang. DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern Generator. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 124-129, IEEE, 2020. [doi]
@inproceedings{YehH20-1,
title = {DSSP-ATPG: A Deterministic Search-Space Parallel Test Pattern Generator},
author = {Kuen-Wei Yeh and Jiun-Lang Huang},
year = {2020},
doi = {10.1109/ITC-Asia51099.2020.00033},
url = {https://doi.org/10.1109/ITC-Asia51099.2020.00033},
researchr = {https://researchr.org/publication/YehH20-1},
cites = {0},
citedby = {0},
pages = {124-129},
booktitle = {IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-8944-4},
}