The following publications are possibly variants of this publication:
- CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern GeneratorKuen-Wei Yeh, Jiun-Lang Huang, Laung-Terng Wang. et, 32(5):625-638, 2016. [doi]
- A circular pipeline processing based deterministic parallel test pattern generatorKuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang. itc 2013: 1-8 [doi]
- SDC-TPG: A Deterministic Zero-Inflation Parallel Test Pattern GeneratorChun-Hao Chang, Kuen-Wei Yeh, Jiun-Lang Huang, Laung-Terng Wang. ats 2015: 43-48 [doi]