Kuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang. A circular pipeline processing based deterministic parallel test pattern generator. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-8, IEEE Computer Society, 2013. [doi]
Abstract is missing.