Kuen-Wei Yeh, Jiun-Lang Huang, Hao-Jan Chao, Laung-Terng Wang. A circular pipeline processing based deterministic parallel test pattern generator. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-8, IEEE Computer Society, 2013. [doi]
@inproceedings{YehHCW13,
title = {A circular pipeline processing based deterministic parallel test pattern generator},
author = {Kuen-Wei Yeh and Jiun-Lang Huang and Hao-Jan Chao and Laung-Terng Wang},
year = {2013},
doi = {10.1109/TEST.2013.6651913},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651913},
researchr = {https://researchr.org/publication/YehHCW13},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013},
publisher = {IEEE Computer Society},
}