Jen-Chieh Yeh, Yan-Ting Lai, Yuan-Yuan Shih, Cheng-Wen Wu, Chien-Hung Ho, Yen-Tai Lin. Flash Memory Built-In Self-Diagnosis with Test Mode Control. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 15-20, IEEE Computer Society, 2005. [doi]
Abstract is missing.