Chia-Chih Yen, Ten Lin, Hermes Lin, Kai Yang, Ta-Yung Liu, Yu-Chin Hsu. A General Failure Candidate Ranking Framework for Silicon Debug. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 352-358, IEEE Computer Society, 2008. [doi]
Abstract is missing.