Joonhwan Yi, John P. Hayes. The Coupling Model for Function and Delay Faults. J. Electronic Testing, 21(6):631-649, 2005. [doi]
@article{YiH05:1,
title = {The Coupling Model for Function and Delay Faults},
author = {Joonhwan Yi and John P. Hayes},
year = {2005},
doi = {10.1007/s10836-005-3476-y},
url = {http://dx.doi.org/10.1007/s10836-005-3476-y},
tags = {meta-model, Meta-Environment},
researchr = {https://researchr.org/publication/YiH05%3A1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {21},
number = {6},
pages = {631-649},
}