Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects - researchr publication authors

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Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]

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