Mahmut Yilmaz, Derek Hower, Sule Ozev, Daniel J. Sorin. Self-Checking and Self-Diagnosing 32-bit Microprocessor Multiplier. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.