Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Adaptive multidimensional outlier analysis for analog and mixed signal circuits. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-8, IEEE, 2011. [doi]
Abstract is missing.