Efficient Process Shift Detection and Test Realignment

Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Efficient Process Shift Detection and Test Realignment. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(12):1934-1942, 2013. [doi]

Authors

Ender Yilmaz

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Sule Ozev

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Kenneth M. Butler

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