Ender Yilmaz, Sule Ozev, Kenneth M. Butler. Efficient Process Shift Detection and Test Realignment. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(12):1934-1942, 2013. [doi]
@article{YilmazOB13-1,
title = {Efficient Process Shift Detection and Test Realignment},
author = {Ender Yilmaz and Sule Ozev and Kenneth M. Butler},
year = {2013},
doi = {10.1109/TCAD.2013.2276614},
url = {http://dx.doi.org/10.1109/TCAD.2013.2276614},
researchr = {https://researchr.org/publication/YilmazOB13-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {32},
number = {12},
pages = {1934-1942},
}