Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen. The scan-DFT features of AMD's next-generation microprocessor core. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 39-48, IEEE, 2010. [doi]
@inproceedings{YilmazWROSEFGC10, title = {The scan-DFT features of AMD's next-generation microprocessor core}, author = {Mahmut Yilmaz and Baosheng Wang and Jayalakshmi Rajaraman and Tom Olsen and Kanwaldeep Sobti and Dwight Elvey and Jeff Fitzgerald and Grady Giles and Wei-Yu Chen}, year = {2010}, doi = {10.1109/TEST.2010.5699203}, url = {http://dx.doi.org/10.1109/TEST.2010.5699203}, researchr = {https://researchr.org/publication/YilmazWROSEFGC10}, cites = {0}, citedby = {0}, pages = {39-48}, booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010}, editor = {Ron Press and Erik H. Volkerink}, publisher = {IEEE}, isbn = {978-1-4244-7206-2}, }