A Prevenient Voltage Stress Test Method for High Density Memory - researchr publication authors

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Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang. A Prevenient Voltage Stress Test Method for High Density Memory. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 516-520, IEEE Computer Society, 2008. [doi]

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