Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang. A Prevenient Voltage Stress Test Method for High Density Memory. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 516-520, IEEE Computer Society, 2008. [doi]
@inproceedings{YimKNSLLKKLK08,
title = {A Prevenient Voltage Stress Test Method for High Density Memory},
author = {Jongsoo Yim and Gunbae Kim and Incheol Nam and Sangki Son and Jonghyoung Lim and Hwacheol Lee and Sangseok Kang and Byungheon Kwak and Jinseok Lee and Sungho Kang},
year = {2008},
doi = {10.1109/DELTA.2008.93},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.93},
tags = {testing},
researchr = {https://researchr.org/publication/YimKNSLLKKLK08},
cites = {0},
citedby = {0},
pages = {516-520},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}