The compact Vth model for biaxial strained Si NMOSFET

Shujuan Yin. The compact Vth model for biaxial strained Si NMOSFET. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.