Leyi Yin, Peng Li. Exploiting reconfigurability for low-cost in-situ test and monitoring of digital PLLs. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 929-934, ACM, 2010. [doi]
@inproceedings{YinL10,
title = {Exploiting reconfigurability for low-cost in-situ test and monitoring of digital PLLs},
author = {Leyi Yin and Peng Li},
year = {2010},
doi = {10.1145/1837274.1837507},
url = {http://doi.acm.org/10.1145/1837274.1837507},
tags = {testing},
researchr = {https://researchr.org/publication/YinL10},
cites = {0},
citedby = {0},
pages = {929-934},
booktitle = {Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010},
editor = {Sachin S. Sapatnekar},
publisher = {ACM},
isbn = {978-1-4503-0002-5},
}