Exploiting reconfigurability for low-cost in-situ test and monitoring of digital PLLs

Leyi Yin, Peng Li. Exploiting reconfigurability for low-cost in-situ test and monitoring of digital PLLs. In Sachin S. Sapatnekar, editor, Proceedings of the 47th Design Automation Conference, DAC 2010, Anaheim, California, USA, July 13-18, 2010. pages 929-934, ACM, 2010. [doi]

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