Design and testing of CMOS compatible EEPROM

Haibin Yin, Xiaohong Peng, Peiyuan Wan, Jinhui Wang, Ligang Hou. Design and testing of CMOS compatible EEPROM. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]

Abstract

Abstract is missing.