Digital built-in self-test of CMOS analog iterative decoders - researchr publication authors

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Mimi Yiu, Chris Winstead, Vincent C. Gaudet, Christian Schlegel. Digital built-in self-test of CMOS analog iterative decoders. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2204-2207, IEEE, 2005. [doi]

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